Abstract
A high mobility (̃79 cm 2Vs) amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) with high output driving current has been demonstrated. We used a new structure with nano-dots doping on the channel of semiconductor devices. This device is proposed to increase the field-effect mobility 17 times larger than that of the control sample. The influence of dots concentration and the doping concentration on device characteristics were investigated. In addition, we also studied the bottom gate device with NDD. We successfully demonstrate an effective and simple concept to improve device characteristics.
Original language | English |
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Pages (from-to) | 28-31 |
Number of pages | 4 |
Journal | Digest of Technical Papers - SID International Symposium |
Volume | 42 |
Issue number | 1 |
DOIs | |
State | Published - 1 Jun 2011 |
Event | 49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011 - Los Angeles, CA, United States Duration: 15 May 2011 → 20 May 2011 |