TY - GEN
T1 - High-density MOM capacitor array with novel mortise-tenon structure for low-power SAR ADC
AU - Chen, Nai Chen
AU - Chou, Pang Yen
AU - Graeb, Helmut
AU - Lin, Po-Hung
PY - 2017/5/11
Y1 - 2017/5/11
N2 - The design of capacitor structures have great impact on capacitance density, parasitic capacitance, routability, and matching quality of capacitor network in a SAR ADC, which may affect power, performance, and area of the whole data converter. Most of the recent studies focused on common-centroid placement and routing optimization of the capacitor network. Only few of them investigated the structures of highly integrated capacitors. In this paper, a novel mortise-tenon metal-oxide-metal capacitor structure is proposed, which has the advantages of high capacitance density and small parasitic capacitance. Based on the proposed structure, an integer-linear-programming based capacitor sizing and routing parasitic matching method is further introduced. Experimental results show that the proposed structure and method can achieve the best capacitance density and matching quality of the capacitor network in a SAR ADC.
AB - The design of capacitor structures have great impact on capacitance density, parasitic capacitance, routability, and matching quality of capacitor network in a SAR ADC, which may affect power, performance, and area of the whole data converter. Most of the recent studies focused on common-centroid placement and routing optimization of the capacitor network. Only few of them investigated the structures of highly integrated capacitors. In this paper, a novel mortise-tenon metal-oxide-metal capacitor structure is proposed, which has the advantages of high capacitance density and small parasitic capacitance. Based on the proposed structure, an integer-linear-programming based capacitor sizing and routing parasitic matching method is further introduced. Experimental results show that the proposed structure and method can achieve the best capacitance density and matching quality of the capacitor network in a SAR ADC.
UR - http://www.scopus.com/inward/record.url?scp=85020171705&partnerID=8YFLogxK
U2 - 10.23919/DATE.2017.7927277
DO - 10.23919/DATE.2017.7927277
M3 - Conference contribution
AN - SCOPUS:85020171705
T3 - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
SP - 1757
EP - 1762
BT - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 20th Design, Automation and Test in Europe, DATE 2017
Y2 - 27 March 2017 through 31 March 2017
ER -