TY - JOUR
T1 - High-contrast fluorescence polarization microscopy through stimulated emission
AU - Ur Rehman, Khalil
AU - Das, Subir
AU - Kao, Fu Jen
N1 - Publisher Copyright:
© 2021 The Japan Society of Applied Physics
PY - 2021/2
Y1 - 2021/2
N2 - In this work, we demonstrate the contrast enhancement through polarization-resolved pump-probe microscopy, implemented by measuring the spontaneous fluorescence loss induced by stimulated emission. The pump-probe measurement is compared with the conventional fluorescence polarization microscopy. The anisotropy values thus obtained are 0.11 and 0.01, respectively. The contrast improvement is attributed to the multiphoton mechanism in sharpening the point-spread function and the polarization resolving. In addition, the pump-probe technique promises higher temporal resolution in lifetime measurements than time-correlated single-photon counting, enabling more precise determination of the fluorescent molecules' rotational diffusion time constant, which is often in the sub-nanosecond regime.
AB - In this work, we demonstrate the contrast enhancement through polarization-resolved pump-probe microscopy, implemented by measuring the spontaneous fluorescence loss induced by stimulated emission. The pump-probe measurement is compared with the conventional fluorescence polarization microscopy. The anisotropy values thus obtained are 0.11 and 0.01, respectively. The contrast improvement is attributed to the multiphoton mechanism in sharpening the point-spread function and the polarization resolving. In addition, the pump-probe technique promises higher temporal resolution in lifetime measurements than time-correlated single-photon counting, enabling more precise determination of the fluorescent molecules' rotational diffusion time constant, which is often in the sub-nanosecond regime.
UR - http://www.scopus.com/inward/record.url?scp=85100403110&partnerID=8YFLogxK
U2 - 10.35848/1882-0786/abdc9d
DO - 10.35848/1882-0786/abdc9d
M3 - Article
AN - SCOPUS:85100403110
SN - 1882-0778
VL - 14
JO - Applied Physics Express
JF - Applied Physics Express
IS - 2
M1 - 022008
ER -