Hierarchical Active Voltage Regulation for Heterogeneous TSV 3D-ICs

Po Tsang Huang, Tzung Han Tsai, Po Jen Yang, Wei Hwang, Hung-Ming Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Among different system-in-package (SiP) technologies, through-silicon-via (TSV) 3D-IC is the key to the success of future heterogeneous SiP integration due to the high interconnect density. In heterogeneous TSV 3D integration, however, the increasing current density through both package and TSVs would lead to a large simultaneous switching noise (SSN) potentially. In this paper, a 3D power network with hierarchical active voltage regulation is proposed to reduce dynamic noises for heterogeneous TSV 3D-ICs. For the hierarchical active voltage regulation, the global power network and the local power networks are decoupled by fully-integrated voltage regulators (FIVRs). Furthermore, active switched decoupling capacitors (DECAPs) and distributed FIVRs are adopted as the global regulator and local regulators, respectively. Additionally, a substrate noise suppression technique is also presented to enhance the power integrity by reducing both substrate and TSV coupling noises. These techniques achieve not only for reducing the required DECAPs but providing flexible power sources. The modeling and simulation results of a heterogeneous TSV 3D integration demonstrate that the noise reduction on power supply pairs (VDD GND) are suppressed by up to 71.10% with only 1.11% power overhead.

Original languageEnglish
Title of host publicationProceedings - 33rd IEEE International System on Chip Conference, SOCC 2020
EditorsGang Qu, Jinjun Xiong, Danella Zhao, Venki Muthukumar, Md Farhadur Reza, Ramalingam Sridhar
PublisherIEEE Computer Society
Pages242-247
Number of pages6
ISBN (Electronic)9781728187457
DOIs
StatePublished - 8 Sep 2020
Event33rd IEEE International System on Chip Conference, SOCC 2020 - Virtual, Las Vegas, United States
Duration: 8 Sep 202011 Sep 2020

Publication series

NameInternational System on Chip Conference
Volume2020-September
ISSN (Print)2164-1676
ISSN (Electronic)2164-1706

Conference

Conference33rd IEEE International System on Chip Conference, SOCC 2020
Country/TerritoryUnited States
CityVirtual, Las Vegas
Period8/09/2011/09/20

Keywords

  • TSV 3D-IC
  • active DECAP
  • fully-integrated voltage regulators
  • power integrity

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