Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society

Jason Rupe, Phil Laplante, Shiuhpyng Winston Shieh

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	3-6
Number of pages	4
Journal	IEEE Transactions on Reliability
Volume	73
Issue number	1
DOIs	https://doi.org/10.1109/TR.2024.3366027
State	Published - 1 Mar 2024

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title = "Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society",

author = "Jason Rupe and Phil Laplante and Shieh, {Shiuhpyng Winston}",

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