@inproceedings{d539f7fcabc8462698a6f68b648bc35d,
title = "GraphRSim: A Joint Device-Algorithm Reliability Analysis for ReRAM-based Graph Processing",
abstract = "Graph processing has attracted a lot of interests in recent years as it plays a key role to analyze huge datasets. ReRAM-based accelerators provide a promising solution to accelerate graph processing. However, the intrinsic stochastic behavior of ReRAM devices makes its computation results unreliable. In this paper, we build a simulation platform to analyze the impact of non-ideal ReRAM devices on the error rates of various graph algorithms. We show that the characteristic of the targeted graph algorithm and the type of ReRAM computations employed greatly affect the error rates. Using representative graph algorithms as case studies, we demonstrate that our simulation platform can guide chip designers to select better design options and develop new techniques to improve reliability.",
author = "Nien, {Chin Fu} and Hsiao, {Yi Jou} and Cheng, {Hsiang Yun} and Wen, {Cheng Yu} and Ko, {Ya Cheng} and Lin, {Che Ching}",
note = "Publisher Copyright: {\textcopyright} 2020 EDAA.; 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 ; Conference date: 09-03-2020 Through 13-03-2020",
year = "2020",
month = mar,
doi = "10.23919/DATE48585.2020.9116232",
language = "English",
series = "Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1478--1483",
editor = "{Di Natale}, Giorgio and Cristiana Bolchini and Elena-Ioana Vatajelu",
booktitle = "Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020",
address = "美國",
}