Grain boundary trap-induced current transient in a 3-D NAND flash cell string

Wei Liang Lin*, Wen Jer Tsai, C. C. Cheng, S. H. Ku, Lenvis Liu, S. W. Hwang, Tao Cheng Lu, Kuang Chao Chen, Tseung-Yuen Tseng, Chih Yuan Lu

*Corresponding author for this work

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