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Ge0.83Sn0.17 p-channel metal-oxide-semiconductor field-effect transistors: Impact of sulfur passivation on gate stack quality
Dian Lei, Wei Wang, Zheng Zhang, Jisheng Pan, Xiao Gong*, Gengchiau Liang, Eng Soon Tok, Yee Chia Yeo
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
46
Scopus
citations