Abstract
We report the fabrication and electrical characterization of single-hole transistors (SHTs), in which a Ge spherical quantum dot (QD) weakly couples to self-aligned electrodes via self-organized tunnel barriers of Si3N4. A combination of lithographic patterning, sidewall spacers, and self-assembled growth was used for fabrication. The core experimental approach is based on the selective oxidation of poly-SiGe spacer islands located at the specially designed included-angle locations of Si3N4/Si-trenches. By adjusting processing times for conformal deposition, etch back and thermal oxidation, good tunability in the Ge QD size and its tunnel-barrier widths were controllably achieved. Each Ge QD is electrically addressable via self-aligned Si gate and reservoirs, thus offering an effective building block for implementing single-charge devices.
Original language | English |
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Pages (from-to) | 54-59 |
Number of pages | 6 |
Journal | IEEE Journal of the Electron Devices Society |
Volume | 11 |
DOIs | |
State | Published - 2023 |
Keywords
- Ge
- quantum dot
- single-hole transistors