@inproceedings{6237298d0cdb48c297b396779ca504b6,
title = "Gate Voltages Impacting on Latch-up Measurements",
abstract = "Integrated Circuits (ICs) are often turned off under latch-up measurements. One power IC is often applied with a large size for driving capabilities. The large size device is often difficult to be turned off under latch-up stresses. In this paper, device behaviors of different gate biased voltages applied on large size devices under latch-up measurements are discussed. From the silicon data analyses, latch-up current paths changed from MOSFET to the parasitic diodes are observed well so the false latch-up test is verified. Finally, over voltage test is proposed for turned-on large size devices' latch-up measurements.",
author = "Huang, {Shao Chang} and Lee, {Jian Hsing} and Chen, {Chun Chih} and Li, {Ching Ho} and Liao, {Chih Cherng} and Hsu, {Kai Chieh} and Lin, {Gong Kai} and Chen, {Li Fan} and Wang, {Chien Wei} and Lin, {Chih Hsuan} and Jou, {Yeh Ning} and Chen, {Ke Horng}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 ; Conference date: 06-07-2022 Through 08-07-2022",
year = "2022",
doi = "10.1109/ICCE-Taiwan55306.2022.9869282",
language = "English",
series = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "75--76",
booktitle = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",
address = "美國",
}