@inproceedings{bd2c228b5bd045ebb291cac32ec622af,
title = "Framing patent indicators for innovation study",
abstract = "Patent indicators are increasingly used to assess competitive advantage or technology development trends for innovation studies. There are a number of patent indicators proposed in the literature to access such technology-based innovativeness. However, most of the studies arbitrarily select patent indicators for their investigations without optimizing the choice of indicators. Only a limited researchers attempt to classify patent indicators to assist the selection of indicators for diverse research objectives. In this paper, a novel framework structure is provided to frame patent indicators accepted in scientific literature after extensive review on patent related journal papers. The framework provides insights on comprehensive correlations as well as management implications of obtainable patent indicators. It is expected that this framework can be served as a channel for innovation studies to uncover much wider and systematic insights from the application of patent indicators.",
author = "Lee, {Peng I.} and Hsin-Ning Su",
year = "2017",
month = jan,
day = "4",
doi = "10.1109/PICMET.2016.7806676",
language = "English",
series = "PICMET 2016 - Portland International Conference on Management of Engineering and Technology: Technology Management For Social Innovation, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1021--1030",
editor = "Anderson, {Timothy R.} and Kocaoglu, {Dundar F.} and Kiyoshi Niwa and Gary Perman and Kozanoglu, {Dilek Cetindamar} and Daim, {Tugrul U.}",
booktitle = "PICMET 2016 - Portland International Conference on Management of Engineering and Technology",
address = "United States",
note = "null ; Conference date: 04-09-2016 Through 08-09-2016",
}