Original language | English |
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Article number | 6365857 |
Pages (from-to) | 588 |
Number of pages | 1 |
Journal | IEEE Transactions on Device and Materials Reliability |
Volume | 12 |
Issue number | 4 |
DOIs | |
State | Published - 2012 |
Foreword for the special issue on ESD technology
Gianluca Boselli*, Ming-Dou Ker, Charvaka Duvvury
*Corresponding author for this work
Research output: Contribution to journal › Editorial