Foreword

Shyh-Jye Jou^*, C. Patrick Yue

^*Corresponding author for this work

Research output: Contribution to journal › Editorial

Original language	English
Article number	5783574
Journal	Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
DOIs	https://doi.org/10.1109/VDAT.2011.5783574
State	Published - 28 Jun 2011
Event	2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 - Hsinchu, Taiwan Duration: 25 Apr 2011 → 28 Apr 2011

Access to Document

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title = "Foreword",

author = "Shyh-Jye Jou and Yue, {C. Patrick}",

year = "2011",

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language = "English",

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AU - Yue, C. Patrick

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