@inproceedings{bd37250fc5e64ef78337fe391883a346,
title = "Flaw inspection and detection for small-pixel TFT-Array",
abstract = "The display pixels and resolution on array process are getting smaller and higher precision, for advanced small-pixel and high-resolution display applications. The paper proposed the characteristics of flaw detection in small-pixel design displays based on TFT liquid crystal displays with respect to electrical-physic characterization metrics. Observer studies resulted in small-sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small-pixel design for advanced display technologies .It also shown that critical pixel defect played an important role than previously seen in non-small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the small-sized pixel designs for advanced and precision to diagnostic images in display devices.",
keywords = "Flaw detection, Flaw inspection, Small-pixel, TFT-Array",
author = "Wang, {Y. C.} and Bor-Shyh Lin",
year = "2013",
month = jan,
day = "1",
language = "English",
series = "Proceedings of the International Display Workshops",
publisher = "International Display Workshops",
pages = "651--652",
booktitle = "20th International Display Workshops 2013, IDW 2013",
note = "20th International Display Workshops 2013, IDW 2013 ; Conference date: 03-12-2013 Through 06-12-2013",
}