Fingerprint
Dive into the research topics of 'Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices
Ruo Yin Liao, Hsuan Han Chen, Ping Yu Lin, Ting An Liang, Kuan Hung Su, I. Cheng Lin, Chen Hao Wen, Wu Ching Chou, Hsiao Hsuan Hsu*, Chun Hu Cheng*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review