Fault-Tolerance Mechanism Analysis on NVDLA-Based Design Using Open Neural Network Compiler and Quantization Calibrator

Shu Ming Liu, Luba Tang, Ning Chi Huang, Der Yu Tsai, Ming Xue Yang, Kai Chiang Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

The NVIDIA Deep Learning Accelerator (NVDLA) provides free intellectual property licensing to IC chip vendors and researchers to build a chip that uses deep neural networks for inference applications. The Open Neural Network Compiler (ONNC) provides an extensible compiler, a quantization calibrator and optimization supports for running DNN models on NVDLA-based SoCs. Even with open-sourced NVDLA and ONNC, conducting the development of an AI chip still brings up many productivity issues in the mass production stage, such as SRAM MBIST (Memory Built-In Self Test) fail, scan-chain fail etc. When applying Fault-Tolerance Mechanism in error-Tolerant applications such as image classification by using the AI CNN model, this paper presents a light-weight Fault-Tolerance Mechanism to effectively enhance the robustness of NVDLA-based edge AI chip when encountering internal SRAM stuck fault. Our non-Accurate MAC calculation for the whole convolution computation leads to a very promising quality of results compared to the case when an exactly accurate convolution operation is used. The Fault-Tolerance Mechanism analysis and design described in this paper can also apply to the similar fixed-point deep learning accelerator design, and opens new opportunities for research as well as product development.

Original languageEnglish
Title of host publication2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
ISBN (Electronic)9781728160832
DOIs
StatePublished - 10 Aug 2020
Event2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020 - Hsinchu, Taiwan
Duration: 10 Aug 202013 Aug 2020

Publication series

Name2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020

Conference

Conference2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020
Country/TerritoryTaiwan
CityHsinchu
Period10/08/2013/08/20

Keywords

  • Compilers
  • Deep learning accelerators
  • fault tolerant
  • NVDLA
  • ONNC

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