@inproceedings{75758b4733e24f7d851ac31d4ca9e392,
title = "Fault-Tolerance Mechanism Analysis on NVDLA-Based Design Using Open Neural Network Compiler and Quantization Calibrator",
abstract = "The NVIDIA Deep Learning Accelerator (NVDLA) provides free intellectual property licensing to IC chip vendors and researchers to build a chip that uses deep neural networks for inference applications. The Open Neural Network Compiler (ONNC) provides an extensible compiler, a quantization calibrator and optimization supports for running DNN models on NVDLA-based SoCs. Even with open-sourced NVDLA and ONNC, conducting the development of an AI chip still brings up many productivity issues in the mass production stage, such as SRAM MBIST (Memory Built-In Self Test) fail, scan-chain fail etc. When applying Fault-Tolerance Mechanism in error-Tolerant applications such as image classification by using the AI CNN model, this paper presents a light-weight Fault-Tolerance Mechanism to effectively enhance the robustness of NVDLA-based edge AI chip when encountering internal SRAM stuck fault. Our non-Accurate MAC calculation for the whole convolution computation leads to a very promising quality of results compared to the case when an exactly accurate convolution operation is used. The Fault-Tolerance Mechanism analysis and design described in this paper can also apply to the similar fixed-point deep learning accelerator design, and opens new opportunities for research as well as product development. ",
keywords = "Compilers, Deep learning accelerators, fault tolerant, NVDLA, ONNC",
author = "Liu, {Shu Ming} and Luba Tang and Huang, {Ning Chi} and Tsai, {Der Yu} and Yang, {Ming Xue} and Wu, {Kai Chiang}",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020 ; Conference date: 10-08-2020 Through 13-08-2020",
year = "2020",
month = aug,
day = "10",
doi = "10.1109/VLSI-DAT49148.2020.9196335",
language = "English",
series = "2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--3",
booktitle = "2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020",
address = "美國",
}