Fault dictionary size reduction for million-gate large circuits

Yu R. Hong; Juinn-Dar Huang

doi:10.1109/ASPDAC.2007.358092

Fault dictionary size reduction for million-gate large circuits

Yu R. Hong^*, Juinn-Dar Huang

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.

Original language	English
Title of host publication	Proceedings of the ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007
Pages	829-834
Number of pages	6
DOIs	https://doi.org/10.1109/ASPDAC.2007.358092
State	Published - 1 Dec 2007
Event	ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007 - Yokohama, Japan Duration: 23 Jan 2007 → 27 Jan 2007

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference	ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007
Country/Territory	Japan
City	Yokohama
Period	23/01/07 → 27/01/07

Access to Document

10.1109/ASPDAC.2007.358092

Cite this

@inproceedings{cd865d28a1fd447d83fb1d48649baf53,

title = "Fault dictionary size reduction for million-gate large circuits",

abstract = "In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.",

author = "Hong, {Yu R.} and Juinn-Dar Huang",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/ASPDAC.2007.358092",

language = "English",

isbn = "1424406293",

series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",

pages = "829--834",

booktitle = "Proceedings of the ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007",

note = "ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007 ; Conference date: 23-01-2007 Through 27-01-2007",

}

Hong, YR & Huang, J-D 2007, Fault dictionary size reduction for million-gate large circuits. in Proceedings of the ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007., 4196138, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 829-834, ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007, Yokohama, Japan, 23/01/07. https://doi.org/10.1109/ASPDAC.2007.358092

Fault dictionary size reduction for million-gate large circuits. / Hong, Yu R.; Huang, Juinn-Dar.
Proceedings of the ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007. 2007. p. 829-834 4196138 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.

AB - In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.

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Fault dictionary size reduction for million-gate large circuits

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