Fabrication and X-ray absorption spectroscopy in layered cobaltate Na x CoO 2 thin films

W. J. Chang*, Jiunn-Yuan Lin, T. Y. Chung, J. M. Chen, C. H. Hsu, S. Y. Hsu, T. M. Uen, Kaung-Hsiung Wu, Y. S. Gou, Jenh-Yih Juang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

NaxCoO2 (x∼0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co3O4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity ρab, the single phase and the metallic behaviors of these NaxCoO2 films can be identified. For the same sodium content x, ρab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.

Original languageEnglish
Pages (from-to)e335-e336
JournalJournal of Magnetism and Magnetic Materials
Volume310
Issue number2 SUPPL. PART 2
DOIs
StatePublished - Mar 2007

Keywords

  • Lateral diffusion
  • Layered cobaltates
  • NaCoO thin film
  • X-ray absorption spectroscopy
  • X-ray diffraction

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