Fabrication and X-ray absorption spectroscopy in layered cobaltate Na x CoO 2 thin films

W. J. Chang; Jiunn-Yuan Lin; T. Y. Chung; J. M. Chen; C. H. Hsu; S. Y. Hsu; T. M. Uen; Kaung-Hsiung Wu; Y. S. Gou; Jenh-Yih Juang

doi:10.1016/j.jmmm.2006.10.301

Fabrication and X-ray absorption spectroscopy in layered cobaltate Na _x CoO ₂ thin films

W. J. Chang^*, Jiunn-Yuan Lin, T. Y. Chung, J. M. Chen, C. H. Hsu, S. Y. Hsu, T. M. Uen, Kaung-Hsiung Wu, Y. S. Gou, Jenh-Yih Juang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Na _x CoO ₂ (x∼0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co ₃ O ₄ (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity ρ _ab , the single phase and the metallic behaviors of these Na _x CoO ₂ films can be identified. For the same sodium content x, ρ _ab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.

Original language	English
Journal	Journal of Magnetism and Magnetic Materials
Volume	310
Issue number	2 SUPPL. PART 2
DOIs	https://doi.org/10.1016/j.jmmm.2006.10.301
State	Published - 1 Mar 2007

Keywords

Lateral diffusion
Layered cobaltates
Na CoO thin film
X-ray absorption spectroscopy
X-ray diffraction

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10.1016/j.jmmm.2006.10.301

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title = "Fabrication and X-ray absorption spectroscopy in layered cobaltate Na x CoO 2 thin films",

abstract = " Na x CoO 2 (x∼0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co 3 O 4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity ρ ab , the single phase and the metallic behaviors of these Na x CoO 2 films can be identified. For the same sodium content x, ρ ab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.",

keywords = "Lateral diffusion, Layered cobaltates, Na CoO thin film, X-ray absorption spectroscopy, X-ray diffraction",

author = "Chang, {W. J.} and Jiunn-Yuan Lin and Chung, {T. Y.} and Chen, {J. M.} and Hsu, {C. H.} and Hsu, {S. Y.} and Uen, {T. M.} and Kaung-Hsiung Wu and Gou, {Y. S.} and Jenh-Yih Juang",

year = "2007",

month = mar,

day = "1",

doi = "10.1016/j.jmmm.2006.10.301",

language = "English",

volume = "310",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "2 SUPPL. PART 2",

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TY - JOUR

T1 - Fabrication and X-ray absorption spectroscopy in layered cobaltate Na x CoO 2 thin films

AU - Chang, W. J.

AU - Lin, Jiunn-Yuan

AU - Chung, T. Y.

AU - Chen, J. M.

AU - Hsu, C. H.

AU - Hsu, S. Y.

AU - Uen, T. M.

AU - Wu, Kaung-Hsiung

AU - Gou, Y. S.

AU - Juang, Jenh-Yih

PY - 2007/3/1

Y1 - 2007/3/1

N2 - Na x CoO 2 (x∼0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co 3 O 4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity ρ ab , the single phase and the metallic behaviors of these Na x CoO 2 films can be identified. For the same sodium content x, ρ ab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.

AB - Na x CoO 2 (x∼0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co 3 O 4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity ρ ab , the single phase and the metallic behaviors of these Na x CoO 2 films can be identified. For the same sodium content x, ρ ab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.

KW - Lateral diffusion

KW - Layered cobaltates

KW - Na CoO thin film

KW - X-ray absorption spectroscopy

KW - X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=33847305121&partnerID=8YFLogxK

U2 - 10.1016/j.jmmm.2006.10.301

DO - 10.1016/j.jmmm.2006.10.301

M3 - Article

AN - SCOPUS:33847305121

SN - 0304-8853

VL - 310

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 2 SUPPL. PART 2

ER -

Fabrication and X-ray absorption spectroscopy in layered cobaltate Na _x CoO ₂ thin films

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Keywords

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