Fabrication and electrical characterization of nanoscaled-schottky diodes based on metal suicide/silicon nanowires with scanning probe lithography and wet etching

Jeng-Tzong Sheu*, Sheng Pin Yeh, Chen Hsin Lien, S. T. Tsai

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

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