Fabrication and characterization of a novel suspended-nanowire-channel thin-film transistor with nanometer air gap

Chia Wei Hsu*, Chia Hao Kuo, Hsing Hui Hsu, Horng-Chih Lin, Tiao Yuan Huang

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    In this work, a novel suspended-NW-channel TFT was fabricated and characterized successfully. With the simple and low-cost over-etching-time- controlled RIE technique and a BOE wet etch process, the suspended NWs of 52 nm and an air gap of 100 nm is achieved. It is also found that the fabricated device with longer channel length and S/D extension length reduces the pull-in voltage and the hysteresis window.

    Original languageEnglish
    Title of host publicationNEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems
    Pages313-316
    Number of pages4
    DOIs
    StatePublished - 2011
    Event6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011 - Kaohsiung, Taiwan
    Duration: 20 Feb 201123 Feb 2011

    Publication series

    NameNEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems

    Conference

    Conference6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011
    Country/TerritoryTaiwan
    CityKaohsiung
    Period20/02/1123/02/11

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