Exploring topological defects in epitaxial BiFeO3 thin films

Rama K. Vasudevan, Yi Chun Chen, Hsiang Hua Tai, Nina Balke, Pingping Wu, Saswata Bhattacharya, L. Q. Chen, Ying-hao Chu, I. Nan Lin, Sergei V. Kalinin, Valanoor Nagarajan

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