Exploring Performance and Reliability Behavior of Nanosheet Channel Thin-Film Transistors under Independent Dual Gate Bias Operation

William Cheng Yu Ma*, Chun Jung Su, Kuo Hsing Kao, Yan Qing Chen, Jing Qiang Guo, Cheng Jun Wu, Po Ying Wu, Jia Yuan Hung

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

Chemical Compounds