Experimental evaluation and device simulation of device structure influences on latchup immunity in high-voltage 40-V CMOS process

  • Sheng Fu Hsu*
  • , Ming-Dou Ker
  • , Geeng Lih Lin
  • , Yeh Ning Jou
    • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

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    Engineering

    Material Science

    Earth and Planetary Sciences