Estimating process capability index Cpk: classical approach versus Bayesian approach

Wen Lea Pearn, Chin Chieh Wu, Chia Huang Wu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Abstract

Process capability index Cpk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on Cpk using two approaches, Classical method and Bayesian method.

Original languageEnglish
Pages (from-to)2007-2021
Number of pages15
JournalJournal of Statistical Computation and Simulation
Volume85
Issue number10
DOIs
StatePublished - 3 Jul 2015

Keywords

  • Bayesian method
  • Classical method
  • credible interval
  • lower confidence bound
  • process capability index

Fingerprint

Dive into the research topics of 'Estimating process capability index Cpk: classical approach versus Bayesian approach'. Together they form a unique fingerprint.

Cite this