@inproceedings{97dd7abc56474ff5978731033387d02e,
title = "ESD-transient detection circuit with equivalent capacitance-coupling detection mechanism and high efficiency of layout area in a 65nm CMOS technology",
abstract = "A new power-rail ESD clamp circuit designed with equivalent capacitance-coupling detection mechanism and high efficiency of layout area has been proposed and verified in a 65nm 1.2V CMOS process. The proposed design has better immunity against mis-trigger or transient-induced latch-on event. The layout area and the standby leakage current of the proposed design are much superior to that of traditional RC-based power-rail ESD clamp circuit by both reducing ~46%.",
author = "Yeh, {Chih Ting} and Ming-Dou Ker",
year = "2013",
month = sep,
day = "10",
language = "English",
isbn = "9781585372324",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013",
note = "2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013 ; Conference date: 08-09-2013 Through 13-09-2013",
}