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ESD protection design for wideband RF applications in 65-nm CMOS process
Li Wei Chu, Chun Yu Lin, Ming-Dou Ker, Ming Hsiang Song, Jen Chou Tseng, Chewn Pu Jou, Ming Hsien Tsai
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations