ESD-induced latchup-like failure in a touch panel control IC

Ming-Dou Ker, Po Yen Chiu, Wuu Trong Shieh, Chun Chi Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'ESD-induced latchup-like failure in a touch panel control IC'. Together they form a unique fingerprint.

Engineering & Materials Science