Abstract
The pattern deformational model proposed by Tsai and Fu [11] is extended so that numerical attributes and probability or density distributions can be introduced into primitives and relations in a nonhierarchical relational graph Conventional graph isomorphisms are then generalized to include error-correcting capability for matching deformed patterns represented by such attributed relational graphs. An ordered-search algorithm is proposed for determining error-correcting isomorphisms. Finally, a pattern classification approach using graph isomorphisms is described, which can be considered as a combination of structural and statistical techniques.
| Original language | English |
|---|---|
| Pages (from-to) | 757-768 |
| Number of pages | 12 |
| Journal | IEEE Transactions on Systems, Man and Cybernetics |
| Volume | 9 |
| Issue number | 12 |
| DOIs | |
| State | Published - 1 Jan 1979 |