Original language | English |
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Pages (from-to) | 693 |
Number of pages | 1 |
Journal | Microelectronics Journal |
Volume | 41 |
Issue number | 10 |
DOIs |
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State | Published - Oct 2010 |
Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))
Jin He*, Zhang Xing, Yangyuan Wang, Xuemei Xi, Mansun Chan, Chen-Ming Hu
*Corresponding author for this work
Research output: Contribution to journal › Comment/debate