@inproceedings{92ff08b570294be4bba867b5c2265a4b,
title = "EOS Endurance Power Circuits without Depletion Mode Devices",
abstract = "Electrical Overstress (EOS) avoiding power integrated circuits (ICs) are often designed with depletion mode NMOSFET. In some applications, there can be no depletion mode NMOSFETs. From device normal operations and EOS analyses, new circuits without depletion mode devices are successfully proposed for approaching device typical operations and EOS endurances.",
author = "Huang, {Shao Chang} and Lee, {Jian Hsing} and Li, {Ching Ho} and Chen, {Sue Yi} and Lin, {Chih Hsuan} and Chen, {Chun Chih} and Chen, {Li Fan} and Lin, {Gong Kai} and Wang, {Chien Wei} and Hsu, {Kai Chieh} and Chen, {Szu Chi} and Pai, {Shang Chuan} and Pai, {Fu Wei} and Peng, {Yin Wei} and Liao, {Chih Cherng} and Chen, {Ke Horng}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 ; Conference date: 06-07-2022 Through 08-07-2022",
year = "2022",
doi = "10.1109/ICCE-Taiwan55306.2022.9869061",
language = "English",
series = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "79--80",
booktitle = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",
address = "美國",
}