Enhanced light output in double roughened GaN light-emitting diodes via various texturing treatments of undoped-GaN layer

Wei Chih Peng, Yew-Chuhg Wu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

An InGaN-GaN light-emitting diodes (LEDs) with double roughened (p-GaN and undoped-GaN) surfaces were successfully fabricated by surface-roughening, wafer-bonding and laser lift-off technologies. The effect of the roughness of the undoped-GaN layer on the performance of double roughened LEDs was investigated. It was found that the rms roughness of the undoped-GaN layer increased from 18.6 to 146.7 nm, the output power increased from 7.2 to 10.2 mW, and view angle decreased from 133.6 to 116°.

Original languageEnglish
Pages (from-to)7709-7712
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number10 A
DOIs
StatePublished - 15 Oct 2006

Keywords

  • InGaN-GaN light-emitting diodes
  • Laser lift-off technology
  • Surface-roughening
  • Wafer-bonding

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