Energy-efficient gas recognition system with event-driven power control

Chun Ying Huang, Po-Tsang Huang, Chih Chao Yang, Ching Te Chuang, Wei Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

For energy-limited applications of electronic nose, an application-specific architecture is essential to realize a low-energy gas recognition system. In this paper, a pseudo-zero-leakage gas recognition system is proposed to recognize different gases using event-driven power control. Additionally, this gas recognition system can recognize four different gases with concentration information by drift-insensitive on-line training, achieving 100% recognition accuracy for gas type and 89.4% accuracy for concentration analysis. For further reducing the overall energy consumption, both near-threshold SRAM and low-voltage embedded ReRAM are integrated into the proposed system, respectively. Based on TSMC 65nm LP CMOS process, the total energy of the gas recognition systems with SRAM and ReRAM are only 8.62μJ and 2.04μJ in a sensing period, respectively. Hence, an energy-efficient gas recognition system can be realized by a pseudo-zero-leakage event-driven structure with ReRAM.

Original languageEnglish
Title of host publicationProceedings - 28th IEEE International System on Chip Conference, SOCC 2015
EditorsKaran Bhatia, Thomas Buchner, Danella Zhao, Ramalingam Sridhar
PublisherIEEE Computer Society
Pages245-250
Number of pages6
ISBN (Electronic)9781467390934
DOIs
StatePublished - 12 Feb 2016
Event28th IEEE International System on Chip Conference, SOCC 2015 - Beijing, China
Duration: 8 Sep 201511 Sep 2015

Publication series

NameInternational System on Chip Conference
Volume2016-February
ISSN (Print)2164-1676
ISSN (Electronic)2164-1706

Conference

Conference28th IEEE International System on Chip Conference, SOCC 2015
Country/TerritoryChina
CityBeijing
Period8/09/1511/09/15

Keywords

  • ReRAM
  • event-driven
  • gas recognition
  • zero-leakge

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