ELECTRON TRAPPING IN VERY THIN THERMAL SILICON DIOXIDES.

Mong Song Liang*, Chen-Ming Hu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

103 Scopus citations
Original languageEnglish
Pages (from-to)396-399
Number of pages4
JournalTechnical Digest - International Electron Devices Meeting
DOIs
StatePublished - 1 Dec 1981

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