Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels

Yao Chin Wang; Bor-Shyh Lin; Ming-Che Chan

doi:10.1016/j.measurement.2015.03.018

Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels

Yao Chin Wang^*, Bor-Shyh Lin, Ming-Che Chan

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.

Original language	English
Pages (from-to)	83-87
Number of pages	5
Journal	Measurement: Journal of the International Measurement Confederation
Volume	70
DOIs	https://doi.org/10.1016/j.measurement.2015.03.018
State	Published - 11 Apr 2015

Keywords

Electro-optical measurement
Integrated gate driver
TFT array panel

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10.1016/j.measurement.2015.03.018

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title = "Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels",

abstract = "The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.",

keywords = "Electro-optical measurement, Integrated gate driver, TFT array panel",

author = "Wang, {Yao Chin} and Bor-Shyh Lin and Ming-Che Chan",

note = "Publisher Copyright: {\textcopyright} 2015 Elsevier Ltd.",

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doi = "10.1016/j.measurement.2015.03.018",

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AU - Wang, Yao Chin

AU - Lin, Bor-Shyh

AU - Chan, Ming-Che

PY - 2015/4/11

Y1 - 2015/4/11

N2 - The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.

AB - The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.

KW - Electro-optical measurement

KW - Integrated gate driver

KW - TFT array panel

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JO - Measurement: Journal of the International Measurement Confederation

JF - Measurement: Journal of the International Measurement Confederation

ER -

Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels

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Keywords

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