Abstract
This investigation explores the complex role of Ga vacancy charged defect in the crystalline structure of wurtzite Gallium Nitride (GaN), highlighting a significant increase in electrical conductivity—contrary to conventional beliefs. Through advanced Density Functional Theory (DFT) calculations, the study reveals that specific configurations of Ga vacancy charged defect contribute to a sixfold increase in electrical conductivity in wurtzite GaN. However, it is crucial to note that N vacancy charged defects negatively impact these electrical properties. This detailed theoretical analysis sheds light on how these vacancy charged defects can positively affect conductivity and provides a novel perspective on charged defects in GaN, paving the way for the optimized design of GaN in the future.
Original language | English |
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Article number | 108655 |
Journal | Materials Today Communications |
Volume | 39 |
DOIs | |
State | Published - Jun 2024 |
Keywords
- DFT
- Electrical conductivity
- GaN
- Vacancy charged defect
- Wurtzite