Electrical characterization of Al2O3/n-InAs metaloxidesemiconductor capacitors with various surface treatments

H. D. Trinh, G. Brammertz, Edward Yi Chang, C. I. Kuo, C. Y. Lu, Y. C. Lin, H. Q. Nguyen, Y. Y. Wong, B. T. Tran, K. Tran, H. Tran

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Chemical Compounds