Electrical characteristic fluctuation and suppression in emerging CMOS device and circuit

Keyphrases

• Electrical Characteristics 100%
• CMOS Devices 100%
• CMOS Circuits 100%
• Characteristic Fluctuation 100%
• Suppression Method 50%
• Metal Gate Work Function 50%
• Metal Gate 50%
• Analog Circuits 50%
• Digital Circuits 50%
• Device Engineering 50%
• Oxide Thickness Variation 50%
• Dynamic Properties 50%
• 3D Devices 50%
• Random Dopant Fluctuation 50%
• AC-DC 50%
• Process Variation Effect 50%
• Coupled Simulation 50%
• Work Function Fluctuation 50%
• Transfer Properties 50%
• AC Characteristics 50%

Engineering

• Metal Gate 100%
• Dopants 50%
• Oxide Thickness 50%
• Engineering 50%
• Analog Circuit 50%
• Coupled Circuits 50%
• Dynamic Property 50%
• Process Variation 50%

Material Science

• Electrical Property 100%
• Electronic Circuit 100%
• Doping (Additives) 33%
• Oxide Compound 33%
• Analogue Circuit 33%