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Effects of Process and Gate Doping Species on Negative-Bias-Temperature Instability of p-Channel MOSFETs
Da Yuan Lee*, Tiao Yuan Huang, Horng-Chih Lin, Wan Ju Chiang, Guo Wei Huang, Ta-Hui Wang
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations