Abstract
Pulsed laser deposition was used for the preparation of single-phase electron-doped manganite thin films with nominal composition of La 0.7Ce0.3MnO0 (LCeMO) on SrTiO3 (100) substrates. In situ post deposition annealing was done to relax the possible epitaxial in-plane tensile strain between the film and the substrate. This leads to an increasing c-axis lattice constant accompanied by the formation of secondary CeO2 phase and higher metal-insulator transition temperature. The result is indicative of a strong coupling between the electron and lattice degree of freedom.
Original language | English |
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Pages (from-to) | 4357-4361 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 96 |
Issue number | 8 |
DOIs | |
State | Published - 15 Oct 2004 |