Effect of Oxygen Treatment on the Electrical Performance and Reliability of IWO Thin-Film Transistors

Yi Xuan Chen, Yi Lin Wang, Fu Jyuan Li, Shu-Jui Chang, Tsung En Lee, Chao Ching Cheng, Meng Chien Lee, Hui Hsuan Li, Yu Hsien Lin*, Chao Hsin Chien*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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Material Science

Engineering

Chemical Engineering