Effect of nickel concentration on source/drain series resistance and channel resistance of Ni-metal-induced crystallization thin-film transistors

Engineering & Materials Science

• Thin film transistors 100%
• Crystallization 85%
• Nickel 72%
• Metals 50%
• Polysilicon 36%
• Doping (additives) 34%
• Leakage currents 16%
• Crystalline materials 16%
• Nucleation 16%
• Atoms 16%
• Contamination 15%
• Electric lines 13%
• Silicon 12%
• Degradation 10%

Physics & Astronomy

• nickel 63%
• transistors 62%
• crystallization 60%
• thin films 40%
• metals 40%
• silicon 18%
• transmission lines 10%
• contamination 10%
• leakage 9%
• degradation 8%
• grain size 8%
• nucleation 8%
• causes 6%
• atoms 5%
• performance 4%

Chemical Compounds

• Crystallization 54%
• Resistance 49%
• Polycrystalline Solid 23%
• Donor 17%
• Leakage Current 17%
• Grain Size 12%
• Doping Material 11%
• Nucleation 10%
• Amorphous Material 9%
• Reduction 5%