Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

Chun Yen Yiu, Yiming Li*, Ming Hung Han, Kuo Fu Lee, Thet Thet Khaing, Hui Wen Cheng, Zhong Cheng Su

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

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Physics & Astronomy