Editorial for pattern recognition letters special issue on face-based emotion understanding

Jingting Li; Moi Hoon Yap; Wen Huang Cheng; John See; Xiaopeng Hong; Xiaobai Li; Su Jing Wang

doi:10.1016/j.patrec.2023.02.022

Editorial for pattern recognition letters special issue on face-based emotion understanding

Jingting Li, Moi Hoon Yap, Wen Huang Cheng, John See, Xiaopeng Hong, Xiaobai Li, Su Jing Wang^*

^*Corresponding author for this work

Institute of Electronics

Research output: Contribution to journal › Editorial

1 Scopus citations

Original language	English
Pages (from-to)	8-9
Number of pages	2
Journal	Pattern Recognition Letters
Volume	168
DOIs	https://doi.org/10.1016/j.patrec.2023.02.022
State	Published - Apr 2023

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10.1016/j.patrec.2023.02.022

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title = "Editorial for pattern recognition letters special issue on face-based emotion understanding",

author = "Jingting Li and Yap, {Moi Hoon} and Cheng, {Wen Huang} and John See and Xiaopeng Hong and Xiaobai Li and Wang, {Su Jing}",

year = "2023",

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doi = "10.1016/j.patrec.2023.02.022",

language = "English",

volume = "168",

pages = "8--9",

journal = "Pattern Recognition Letters",

issn = "0167-8655",

publisher = "Elsevier B.V.",

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T1 - Editorial for pattern recognition letters special issue on face-based emotion understanding

AU - Li, Jingting

AU - Yap, Moi Hoon

AU - Cheng, Wen Huang

AU - See, John

AU - Hong, Xiaopeng

AU - Li, Xiaobai

AU - Wang, Su Jing

PY - 2023/4

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U2 - 10.1016/j.patrec.2023.02.022

DO - 10.1016/j.patrec.2023.02.022

M3 - Editorial

AN - SCOPUS:85149064948

SN - 0167-8655

VL - 168

SP - 8

EP - 9

JO - Pattern Recognition Letters

JF - Pattern Recognition Letters

ER -

Editorial for pattern recognition letters special issue on face-based emotion understanding

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