Editorial Cybersecurity in Modern Life

^*Corresponding author for this work

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	1294
Number of pages	1
Journal	IEEE Transactions on Reliability
Volume	72
Issue number	4
DOIs	https://doi.org/10.1109/TR.2023.3329329
State	Published - 1 Dec 2023

Access to Document

@article{fa5f2de862af4142a0acde332d176279,

title = "Editorial Cybersecurity in Modern Life",

author = "Winston Shieh",

year = "2023",

month = dec,

day = "1",

doi = "10.1109/TR.2023.3329329",

language = "English",

volume = "72",

pages = "1294",

journal = "IEEE Transactions on Reliability",

issn = "0018-9529",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "4",

}

TY - JOUR

T1 - Editorial Cybersecurity in Modern Life

AU - Shieh, Winston

PY - 2023/12/1

Y1 - 2023/12/1

UR - http://www.scopus.com/inward/record.url?scp=85181703704&partnerID=8YFLogxK

U2 - 10.1109/TR.2023.3329329

DO - 10.1109/TR.2023.3329329

M3 - Editorial

AN - SCOPUS:85181703704

SN - 0018-9529

VL - 72

SP - 1294

JO - IEEE Transactions on Reliability

JF - IEEE Transactions on Reliability

IS - 4

ER -