Editorial: Advances in the fundamental understanding and prospects for practical applications of high-entropy materials

L. J. Santodonato*, E. Wen Huang, Andreas Kulovits, Peter K. Liaw

*Corresponding author for this work

Research output: Contribution to journalEditorial

Original languageEnglish
Article number986097
JournalFrontiers in Materials
Volume9
DOIs
StatePublished - 7 Sep 2022

Keywords

  • X-ray scattering
  • atom probe tomograghy
  • electron microscopy
  • high-entropy alloy
  • neutron scattering

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