Editorial

Paul R. Berger; Albert Chin; Akira Nishiyama; Meikei Ieong; Renuka P. Jindal

doi:10.1109/JEDS.2016.2597519

Editorial

Paul R. Berger^*, Albert Chin, Akira Nishiyama, Meikei Ieong, Renuka P. Jindal

^*Corresponding author for this work

Institute of Electronics

Research output: Contribution to journal › Editorial

Original language	English
Article number	7549218
Pages (from-to)	202
Number of pages	1
Journal	IEEE Journal of the Electron Devices Society
Volume	4
Issue number	5
DOIs	https://doi.org/10.1109/JEDS.2016.2597519
State	Published - Sep 2016

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10.1109/JEDS.2016.2597519

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@article{26805a197680471291a8477aefd00a6a,

title = "Editorial",

author = "Berger, {Paul R.} and Albert Chin and Akira Nishiyama and Meikei Ieong and Jindal, {Renuka P.}",

year = "2016",

month = sep,

doi = "10.1109/JEDS.2016.2597519",

language = "English",

volume = "4",

pages = "202",

journal = "IEEE Journal of the Electron Devices Society",

issn = "2168-6734",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

}

TY - JOUR

T1 - Editorial

AU - Berger, Paul R.

AU - Chin, Albert

AU - Nishiyama, Akira

AU - Ieong, Meikei

AU - Jindal, Renuka P.

PY - 2016/9

Y1 - 2016/9

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DO - 10.1109/JEDS.2016.2597519

M3 - Editorial

AN - SCOPUS:84984692565

SN - 2168-6734

VL - 4

SP - 202

JO - IEEE Journal of the Electron Devices Society

JF - IEEE Journal of the Electron Devices Society

IS - 5

M1 - 7549218

ER -

Editorial

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