Dynamic supply current waveform estimation with standard library information

Mu Shun Matt Lee, Chien-Nan Liu

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


In the nanometer era, the power integrity problem has become one of the critical issues. Although checking this problem earlier can speed up the analysis, not so many tools are available now due to the limited design information at high levels. Most existing approaches at gate level require extra information of the cell library, which may require extra characterization efforts while migrating to new cell libraries. Therefore, an analytical approach is proposed in this paper to dynamically estimate the supply current waveforms at gate level using existing library information only, even for sequential circuits. The experimental results have shown that the estimation errors of such a quick approach are only 10% compared to HSPICE results.

Original languageEnglish
Pages (from-to)595-606
Number of pages12
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Issue number3
StatePublished - 1 Jan 2010


  • Dynamic supply current
  • Gate-level
  • Standard library


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