TY - GEN
T1 - Dual greedy
T2 - 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
AU - Lin, Wen Huei
AU - Chang, Li-Pin
PY - 2012
Y1 - 2012
N2 - In the recent years, commodity solid-state disks have started adopting powerful controllers and implemented page-level mapping for flash management. However, many of these models still use primitive garbage-collection algorithms, because prior approaches do not scale up with the dramatic increase of flash capacity. This study introduces Dual Greedy for garbage collection in page-level mapping. Dual Greedy identifies page-accurate data hotness using only block-level information, and adaptively switches its preference of victim selection between block space utilization and block stability. It can run in constant time and use very limited RAM space. Our experimental results show that Dual Greedy outperforms existing approaches in terms of garbage-collection overhead, especially with large flash blocks.
AB - In the recent years, commodity solid-state disks have started adopting powerful controllers and implemented page-level mapping for flash management. However, many of these models still use primitive garbage-collection algorithms, because prior approaches do not scale up with the dramatic increase of flash capacity. This study introduces Dual Greedy for garbage collection in page-level mapping. Dual Greedy identifies page-accurate data hotness using only block-level information, and adaptively switches its preference of victim selection between block space utilization and block stability. It can run in constant time and use very limited RAM space. Our experimental results show that Dual Greedy outperforms existing approaches in terms of garbage-collection overhead, especially with large flash blocks.
UR - http://www.scopus.com/inward/record.url?scp=84862063816&partnerID=8YFLogxK
U2 - 10.1109/DATE.2012.6176443
DO - 10.1109/DATE.2012.6176443
M3 - Conference contribution
AN - SCOPUS:84862063816
SN - 9783981080186
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 117
EP - 122
BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
Y2 - 12 March 2012 through 16 March 2012
ER -