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DL-RSIM: A Reliability and Deployment Strategy Simulation Framework for ReRAM-based CNN Accelerators

  • Wei Ting Lin
  • , Hsiang Yun Cheng
  • , Chia Lin Yang
  • , Meng Yao Lin
  • , Kai Lien
  • , Han Wen Hu
  • , Hung Sheng Chang
  • , Hsiang Pang Li
  • , Meng Fan Chang
  • , Yen Ting Tsou
  • , Chin Fu Nien

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Memristor-based deep learning accelerators provide a promising solution to improve the energy efficiency of neuromorphic computing systems. However, the electrical properties and crossbar structure of memristors make these accelerators error-prone. In addition, due to the hardware constraints, the way to deploy neural network models on memristor crossbar arrays affects the computation parallelism and communication overheads. To enable reliable and energy-efficient memristor-based accelerators, a simulation platform is needed to precisely analyze the impact of non-ideal circuit/device properties on the inference accuracy and the influence of different deployment strategies on performance and energy consumption. In this paper, we propose a flexible simulation framework, DL-RSIM, to tackle this challenge. A rich set of reliability impact factors and deployment strategies are explored by DL-RSIM, and it can be incorporated with any deep learning neural networks implemented by TensorFlow. Using several representative convolutional neural networks as case studies, we show that DL-RSIM can guide chip designers to choose a reliability-friendly design option and energy-efficient deployment strategies and develop optimization techniques accordingly.

Original languageEnglish
Article number24
JournalACM Transactions on Embedded Computing Systems
Volume21
Issue number3
DOIs
StatePublished - May 2022

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • Simulation framework
  • deep learning accelerator
  • energy efficiency
  • processing-in-memory
  • reliability
  • resistive random access memory

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