Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu; Y. F. Liao; V. T. Tra; J. C. Yang; W. Z. Liu; Ying-hao Chu; Jiunn-Yuan Lin; J. H. Huang; J. Weinen; S. Agrestini; K. D. Tsuei; D. J. Huang

doi:10.1063/1.3672099

Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu^*
, Y. F. Liao
, V. T. Tra
, J. C. Yang
, W. Z. Liu
, Ying-hao Chu
, Jiunn-Yuan Lin
, J. H. Huang
, J. Weinen
, S. Agrestini
, K. D. Tsuei
, D. J. Huang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

We investigated the electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti ⁴⁺ to Ti ³⁺ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO ₃ with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

Original language	English
Article number	262101
Number of pages	3
Journal	Applied Physics Letters
Volume	99
Issue number	26
DOIs	https://doi.org/10.1063/1.3672099
State	Published - 26 Dec 2011

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Chu, Y. Y., Liao, Y. F., Tra, V. T., Yang, J. C., Liu, W. Z., Chu, Y., Lin, J.-Y., Huang, J. H., Weinen, J., Agrestini, S., Tsuei, K. D., & Huang, D. J. (2011). Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy. Applied Physics Letters, 99(26), Article 262101. https://doi.org/10.1063/1.3672099

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title = "Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy",

abstract = "We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2\% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48{\AA} (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.",

author = "Chu, \{Y. Y.\} and Liao, \{Y. F.\} and Tra, \{V. T.\} and Yang, \{J. C.\} and Liu, \{W. Z.\} and Ying-hao Chu and Jiunn-Yuan Lin and Huang, \{J. H.\} and J. Weinen and S. Agrestini and Tsuei, \{K. D.\} and Huang, \{D. J.\}",

year = "2011",

month = dec,

day = "26",

doi = "10.1063/1.3672099",

language = "English",

volume = "99",

journal = "Applied Physics Letters",

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T1 - Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

AU - Chu, Y. Y.

AU - Liao, Y. F.

AU - Tra, V. T.

AU - Yang, J. C.

AU - Liu, W. Z.

AU - Chu, Ying-hao

AU - Lin, Jiunn-Yuan

AU - Huang, J. H.

AU - Weinen, J.

AU - Agrestini, S.

AU - Tsuei, K. D.

AU - Huang, D. J.

PY - 2011/12/26

Y1 - 2011/12/26

N2 - We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

AB - We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

UR - https://www.scopus.com/pages/publications/84862961755

U2 - 10.1063/1.3672099

DO - 10.1063/1.3672099

M3 - Article

AN - SCOPUS:84862961755

SN - 0003-6951

VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 26

M1 - 262101

ER -

Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy

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